/******************************************************************************* * Copyright (c) 2015-2018 Skymind, Inc. * * This program and the accompanying materials are made available under the * terms of the Apache License, Version 2.0 which is available at * https://www.apache.org/licenses/LICENSE-2.0. * * Unless required by applicable law or agreed to in writing, software * distributed under the License is distributed on an "AS IS" BASIS, WITHOUT * WARRANTIES OR CONDITIONS OF ANY KIND, either express or implied. See the * License for the specific language governing permissions and limitations * under the License. * * SPDX-License-Identifier: Apache-2.0 ******************************************************************************/ // // Created by raver119 on 10.11.2017. // #include "testlayers.h" #include #include #include #include using namespace sd; using namespace sd::graph; class BitwiseUtilsTests : public testing::Test { public: }; // oviously, this test will fail on big-endian machines, but who cares TEST_F(BitwiseUtilsTests, Test_Runtime_Endianess_1) { bool isBE = BitwiseUtils::isBE(); ASSERT_FALSE(isBE); } TEST_F(BitwiseUtilsTests, Test_ValueBit_1) { int idx = BitwiseUtils::valueBit(1); ASSERT_EQ(0, idx); } TEST_F(BitwiseUtilsTests, Test_ValueBit_2) { int idx = BitwiseUtils::valueBit(2); ASSERT_EQ(1, idx); } TEST_F(BitwiseUtilsTests, Test_ValueBits_1) { std::vector expected({1, 1}); while (expected.size() < 32) expected.push_back(0); std::vector result = BitwiseUtils::valueBits(3); ASSERT_EQ(32, result.size()); ASSERT_EQ(expected, result); } TEST_F(BitwiseUtilsTests, Test_ValueBits_2) { int value = 48; int flipped = BitwiseUtils::flip_bits(value); ASSERT_NE(value, flipped); auto o = BitwiseUtils::valueBits(value); auto f = BitwiseUtils::valueBits(flipped); for (int e = 0; e < o.size(); e++) ASSERT_NE(o.at(e), f.at(e)); }